Microscopy

Atomic force microscopes are scanning probe microscopes for surface imaging and analysis of solid materials in air or in liquids. Modern AFMs provide high levels of performance, flexibility and productivity and incorporate the very latest advances in atomic force microscopy techniques. Atomic Force Microscopy is essential in advanced technology industries. Its applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.