X-ray diffraction spectrometers
Description
X-ray diffraction relies on the dual wave/particle nature of X-rays to obtain information about the structure of crystalline materials. A primary use of this versatile and non-destructive technique is the identification and characterization of compounds based on their diffraction pattern. XRD analysis provides high-performance results in a wide range of industrial and research applications including academic research, chemicals, pharmaceuticals, polymers, semiconductors, thin films, metals and minerals.
Types
X-ray diffraction spectrometers
