Tag word “interferometry”, 1 results found

  • New Two-in-One 3D Optical Surface Metrology System

    December 23, 2014

    Leica Microsystems launches a 3D surface metrology system DCM8, uniting confocal microscopy with interferometry. Leica Microsystems presents the new generation 3D profiler Leica DCM8, designed for for non-destructive three-dimensional surface profiling. The instrument is a combined confocal and interferometric optical profiler and therefore provides...

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